Damage, waveguide, and electrical properties in (La, Sr)(Al, Ta)O3 single crystal irradiated with carbon ions

The (La, Sr)(Al, Ta)O 3 crystal was irradiated via 20.0 MeV C ion with fluence of 1.0×10 15 ions/cm 2 . The Rutherford backscattering (RBS)/channeling spectra, the hardness and elastic modulus as continuous functions of the depth, and X-ray diffraction (XRD) are used to analyze the irradiation damage, hardness, and structural changes in the near-surface area of samples. Prism coupling and end-face coupling methods were used to study the changes of optical waveguide properties under different annealing conditions. Considering the potential applications of low-loss waveguide structure in photoelectric sensors, electrical properties of (La, Sr)(Al, Ta)O 3 samples were studied as an important detection indicator of sensors.