X射线光电子能谱
介电谱
金属间化合物
材料科学
合金
腐蚀
微观结构
铝
溶解
分析化学(期刊)
镁合金
冶金
复合材料
化学工程
电化学
化学
物理化学
电极
工程类
色谱法
作者
Chavie Nkoua,Jérôme Esvan,Bernard Tribollet,Régine Basséguy,Christine Blanc
标识
DOI:10.1016/j.corsci.2023.111337
摘要
A combined electrochemical impedance spectroscopy (EIS) and X-ray photoelectron spectroscopy (XPS) approach showed that the corrosion behaviour of 5083 Al alloy was controlled by Mg dissolution at the Mg-rich intermetallic coarse particles (IMCs) that were defects of the passive film. It was thus shown that microstructures with high amount of Mg-rich IMCs were less resistant to corrosion. EIS experimental data were well superimposed with fitted ones calculated using a model proposed in the literature for pure magnesium. The model allowed to plot the resistivity profiles of the passive films, which highlighted their double-layer structure evidenced by XPS.
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