堆积
平面的
材料科学
衍射
电子衍射
结晶学
叠加断层
凝聚态物理
分子物理学
光学
化学
物理
核磁共振
计算机科学
计算机图形学(图像)
标识
DOI:10.1107/s0021889883010213
摘要
Electron microdiffraction patterns have been obtained from regions of diameter about 15 Å in thin crystals of stainless steel containing twin boundaries and stacking faults. The diffraction spots show splittings which are characteristic of the type of defect present as a result of interference effects in the coherent convergent electron beam. The observations of spot splitting are in good agreement with calculations based on simple theoretical models. In conjunction with previous work on antiphase domain boundaries [Zhu & Cowley (1982). Acta Cryst. A 38 , 718–724] these results suggest that the observation of spot splitting is of general relevance for the study of all planar faults in thin crystals.
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