石墨烯
太赫兹辐射
响应度
材料科学
光电子学
热电效应
肖特基势垒
肖特基二极管
结温
光电探测器
纳米技术
物理
热的
二极管
热力学
气象学
作者
Mina Amirmazlaghani,Farshid Raissi
出处
期刊:IEEE Transactions on Device and Materials Reliability
[Institute of Electrical and Electronics Engineers]
日期:2018-08-02
卷期号:18 (3): 429-437
被引量:23
标识
DOI:10.1109/tdmr.2018.2862642
摘要
Recent theories suggest that the photo thermoelectric effect dominates the photo response in graphene. Hot-carrier generation arising from carrier multiplication in graphene under the incident light is introduced as the main cause of this effect. Here, we investigate the possibility of GHz-THz direct detection in a graphene-based device through Hot-carrier effect. The proposed structure is a Schottky junction between graphene and Si. We have measured the optical properties of the junction under 86 GHz and 0.102 THz radiations at room temperature. We have repeated the experiments at cryogenic temperatures down to 150 K. The minimum responsivity of the junction is measured as 2 × 10 4 V/W under 0.102 THz radiations at room temperature. This value increases five-fold at the cryogenic temperatures. We discuss the physics behind room temperature operation of the device based on the photo thermoelectric effect and the hot-carrier generation in graphene under the illuminations. Room temperature and direct detection of GHz and THz radiation in the graphene-Si junction can be practical evidence of hot-carrier generation in graphene under the incident illuminations.
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