超晶格
光电子学
红外线的
材料科学
暗电流
异质结
探测器
锑化镓
钝化
光电探测器
红外探测器
物理
制作
光学
纳米技术
图层(电子)
医学
替代医学
病理
作者
David Z. Ting,Alexander Soibel,Linda Höglund,Jean Nguyen,Cory J. Hill,Arezou Khoshakhlagh,Sarath D. Gunapala
出处
期刊:Semiconductors and Semimetals
日期:2011-01-01
卷期号:: 1-57
被引量:114
标识
DOI:10.1016/b978-0-12-381337-4.00001-2
摘要
This chapter provides an overview of type-II superlattice infrared detectors. The type-II InAs/GaSb superlattices have several fundamental properties that make them suitable for infrared detection: (1) their band gaps can be made arbitrarily small by design, (2) they are more immune to band-to-band tunneling compared with bulk material, (3) the judicious use of strain in type-II InAs/GaInSb strained layer superlattice (SLS) can enhance its absorption strength over that of the type-II InAs/GaSb superlattice to a level comparable with HgVdTe (MCT), and (4) type-II InAs/Ga(In)Sb superlattices also reduce Auger recombination. In addition, the dark current characteristics of type-II superlattice-based single element long-wavelength infrared (LWIR) detectors are currently approaching state-of-the-art MCT detector. Noise measurements highlight the need for surface leakage suppression, which can be tackled by improved etching, passivation, and device design. The chapter also describes the principles behind advanced superlattice infrared detectors based on heterostructure designs. It also explores some aspects of device fabrication and characterization.
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