与非门
错配
材料科学
光电子学
逻辑门
计算机科学
电气工程
和大门
门驱动器
电压
电子工程
晶体管
场效应晶体管
工程类
作者
Shaoyong Yu,Han Joo Lee,Min‐gu Kim,Seongil Im,Young Tack Lee
出处
期刊:ACS Nano
[American Chemical Society]
日期:2024-04-17
卷期号:18 (17): 11404-11415
被引量:3
标识
DOI:10.1021/acsnano.4c01450
摘要
High-performance and low operating voltage are becoming increasingly significant device parameters to meet the needs of future integrated circuit (IC) processors and ensure their energy-efficient use in upcoming mobile devices. In this study, we suggest a hybrid dual-gate switching device consisting of the vertically stacked junction and metal–insulator–semiconductor (MIS) gate structure, named J-MISFET. It shows excellent device performances of low operating voltage (<0.5 V), drain current ON/OFF ratio (∼4.7 × 105), negligible hysteresis window (<0.5 mV), and near-ideal subthreshold slope (SS) (60 mV/dec), making it suitable for low-power switching operation. Furthermore, we investigated the switchable NAND/NOR logic gate operations and the photoresponse characteristics of the J-MISFET under the small supply voltage (0.5 V). To advance the applications further, we successfully demonstrated an integrated optoelectronic security logic system comprising 2-electric inputs (for encrypted data) and 1-photonic input signal (for password key) as a hardware security device for data protection. Thus, we believe that our J-MISFET, with its heterogeneous hybrid gate structures, will illuminate the path toward future device configurations for next-generation low-power electronics and multifunctional security logic systems in a data-driven society.
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