期刊:IEEE Transactions on Instrumentation and Measurement [Institute of Electrical and Electronics Engineers] 日期:2023-01-01卷期号:72: 1-9被引量:5
标识
DOI:10.1109/tim.2023.3309398
摘要
Fringe Projection Profilometry (FPP) method is intensively studied and widely used for its high precision and good anti-noise ability. In practical 3D measurement applications, most metal products do not have the ideal Lambertian surfaces. In addition, too many projected patterns complicate the application of such strategies while improving robustness. We propose a polarization code-multiplexed phase shift (PMPS) method to overcome the above challenges. Our method uses the polarization state of light to assist encoding. The phase is robustly unwrapped with complementary gray code information in the polarization fringe patterns. Compared to the traditional methods, the PMPS method can efficiently and robustly reconstruct metallic objects under the influence of ambient light with half the number of projected patterns.