绝缘体上的硅
薄脆饼
栅栏
硅
氮化硅
光电子学
材料科学
符号
数学
算术
作者
He Li,Yanling He,Andrew Pomerene,Craig Hill,S. L. Ocheltree,Tom Baehr‐Jones,Michael Hochberg
出处
期刊:IEEE Photonics Technology Letters
[Institute of Electrical and Electronics Engineers]
日期:2012-10-24
卷期号:24 (24): 2247-2249
被引量:29
标识
DOI:10.1109/lpt.2012.2225830
摘要
We demonstrate a novel grating coupler fabricated on a silicon-on-insulator (SOI) wafer operating at 1550 nm, based on an ultrathin 50-nm silicon geometry. The devices are fabricated in a CMOS-compatible process with a single etch step. A low insertion loss of ${-}{\rm 3.7}~{\rm dB}$ is achieved. We also calculate the backreflection loss to be ${-}{\rm 14}~{\rm dB}$ . The devices are likely to be useful in terms of light coupling between optical fibers and ultrathin silicon waveguides.
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