硼
溶解度
扩散
杂质
硅
固体溶解度
材料科学
固溶体
航程(航空)
分析化学(期刊)
大气温度范围
热力学
化学
物理化学
冶金
有机化学
复合材料
物理
作者
G. L. Vick,K. M. Whittle
出处
期刊:Journal of The Electrochemical Society
[The Electrochemical Society]
日期:1969-01-01
卷期号:116 (8): 1142-1142
被引量:171
摘要
The solid solubility and diffusion coefficients of boron in silicon have been determined as a function of temperature over the range of 700°–1151°C, by anodically sectioning diffused layers. The solid solubility was found to vary from at 700°C to at 1151°C. The diffusion coefficients for impurity levels below 1018 atoms/cm3 may be represented by . The diffusion coefficients above 1018 atoms/cm3 were found to be dependent on the impurity level.
科研通智能强力驱动
Strongly Powered by AbleSci AI