可靠性(半导体)
估计
可靠性工程
统计
数学
计算机科学
结构工程
工程类
功率(物理)
物理
系统工程
量子力学
作者
Chengqiang Yang,Xiaohui Gu,Zhongmin Xiao
标识
DOI:10.1016/j.probengmech.2024.103584
摘要
Accelerated testing is a valuable approach for enhancing testing efficiency and reducing time costs, thus playing a crucial role in reliability testing. This paper introduces a novel reliability evaluation method that effectively utilizes both accelerated degradation testing (ADT) and accelerated life testing (ALT) data simultaneously, aiming to comprehensively leverage the reliability information of products. To address the challenges posed by contaminated degradation data and unit heterogeneity, the Wiener process is used to model the product degradation process, considering individual difference and measurement error. The proposed method utilizes a Bayesian framework with a MCMC algorithm for parameter estimation based on the two types of accelerated testing data. Furthermore, a simulation study shows that the proposed method can effectively improve the accuracy of product reliability estimation compared with other methods. A practical study for rubber O-rings of the torpedo fuse shows that the proposed method is highly effective in solving practical problems.
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