材料科学
记忆电阻器
电铸
光电子学
薄膜
神经形态工程学
欧姆接触
纳米技术
图层(电子)
电子工程
计算机科学
人工神经网络
工程类
机器学习
作者
Athulya Thomas,Puranjay Saha,Muhammed Sahad E,Navaneeth Krishnan K,Bikas C. Das
标识
DOI:10.1021/acsami.3c19177
摘要
With the advent of the modern era, there is a huge demand for memristor-based neuromorphic computing hardware to overcome the von Neumann bottleneck in traditional computers. Here, we have prepared two-dimensional titanium carbide (Ti3C2Tx) MXene following the conventional HF etching technique in solution. After confirmation of Ti3C2Tx properties by Raman scattering and crystallinity measurements, high-quality thin-film deposition is realized using an immiscible liquid–liquid interfacial growth technique. Following this, the memristor is fabricated by sandwiching a Ti3C2Tx layer with a thickness of 70 nm between two electrodes. Subsequently, current–voltage (I–V) characteristics are measured, revealing a nonvolatile resistive switching property characterized by a swift switching speed of 30 ns and an impressive current On/Off ratio of approximately 103. Furthermore, it exhibits endurance through 500 cycles and retains the states for at least 1 × 104 s without observable degradation. Additionally, it maintains a current On/Off ratio of about 102 while consuming only femtojoules (fJ) of electrical energy per reading. Systematic I–V results and conductive AFM-based current mapping image analysis are converged to support the electroforming mediated filamentary conduction mechanism. Furthermore, our Ti3C2Tx memristor was found to be truly versatile as an all-in-one device for demonstrating edge computation, logic gate operation, and classical conditioning of learning by the brain in Psychology.
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