防反射涂料
宽带
材料科学
蚀刻(微加工)
雕刻
光电子学
基质(水族馆)
光学
波长
纳米颗粒
纳米技术
计算机科学
物理
图层(电子)
海洋学
地质学
复合材料
作者
Nathan J. Ray,Jae‐Hyuck Yoo,Hoàng Tùng Nguyễn,Eyal Feigenbaum
标识
DOI:10.1002/adom.202270037
摘要
In article number 2200151, Nathan J. Ray, Jae-Hyuck Yoo, Hoang T. Nguyen, and Eyal Feigenbaum demonstrate the ability to generate substrate-engraved metasurfaces that can be tailored within a broad design space to satisfy large-area antireflective (AR) applications for bandpass or broadband needs. This is done by dry etching through an advanced nanoparticle etching mask, permitting control over the area coverage of the sub-wavelength metasurface features, as well as the resultant feature lateral spacing, height, and shape. Using this approach, two metasurfaces were fabricated: 1) vertical sidewall nanofeature metasurface for AR applications at 351 nm, and 2) sloped sidewall metasurface designed for broadband ultra-low reflectance applications. To the best of the authors' knowledge, this is the first demonstration of a broadband AR capable of this performance.
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