非阻塞I/O
材料科学
薄膜
溅射沉积
基质(水族馆)
氧化镍
溅射
透射率
光电子学
透明导电膜
电阻率和电导率
兴奋剂
图层(电子)
镍
分析化学(期刊)
光学
复合材料
冶金
纳米技术
化学
电气工程
物理
地质学
工程类
催化作用
海洋学
生物化学
色谱法
作者
Hirotaka Sato,Tadatsugu Minami,S. Takata,Takashi Yamada
标识
DOI:10.1016/0040-6090(93)90636-4
摘要
Transparent and conductive thin films consisting of p-type nickel oxide (NiO) semiconductors were prepared by r.f. magnetron sputtering. A resistivity of 1.4 × 10−1 ohms cm and a hole concentration of 1.3 × 1019 cm−3 were obtained for non-intentionally doped NiO films prepared at a substrate temperature of 200°C in a pure oxygen sputtering gas. An average transmittance of about 40% in the visible range was obtained for a 110 nm thick NiO film. A semitransparent thin film pin diode consisting of p-NiO/i-NiO/i-ZnO/n-ZnO layer having a voltage-current rectification characteristic and an average transmittance above 20% in the visible range was fabricated on a glass substrate.
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