单色仪
衍射仪
材料科学
粉末衍射仪
结构精修
NIST公司
衍射
光学
粉末衍射
石英
计量学
航程(航空)
再现性
强度(物理)
分析化学(期刊)
结晶学
物理
光电子学
化学
扫描电子显微镜
复合材料
计算机科学
自然语言处理
波长
色谱法
作者
M. Wunschel,Robert E. Dinnebier,Sander van Smaalen
出处
期刊:Powder Diffraction
[Cambridge University Press]
日期:2001-09-01
卷期号:16 (3): 149-152
被引量:1
摘要
The characteristics of the (101) peak of α-quartz and the (104) peak of the NIST SRM 1976 alumina flat plate standard have been measured in dependence of time for 60 h with Cu-Kα 1 radiation in Bragg-Brentano geometry with a Philips X’Pert diffractometer equipped with a primary Ge(111) monochromator. It was found that the reproducibility of the peak position and the peak shape falls well in the ±3σ range, whereas the peak intensity strongly depends on the power history of the X-ray generator and the temperature of the diffraction system. The effects on Rietveld refinements are discussed and recommendations are given for optimized data collection.
科研通智能强力驱动
Strongly Powered by AbleSci AI