晶界
材料科学
裂缝闭合
裂纹扩展阻力曲线
断裂力学
裂纹尖端张开位移
晶界强化
扭转
偏转(物理)
巴黎法
平面(几何)
复合材料
机械
几何学
微观结构
光学
数学
物理
作者
Tianrui Zhai,A.J. Wilkinson,J.W. Martin
出处
期刊:Acta Materialia
[Elsevier]
日期:2000-12-01
卷期号:48 (20): 4917-4927
被引量:398
标识
DOI:10.1016/s1359-6454(00)00214-7
摘要
A crystallographic model is proposed which takes into account both crack-plane twist and tilt effects on crack retardation at grain boundaries. The twist and tilt angles of the crack-plane deflection at a grain boundary are the key factors that control the path and growth rate of a short crack. Because of crack-plane twist, the area between the traces on the grain-boundary plane of the crack planes across the boundary has to be fractured in order for the crack to propagate through the boundary. This presents significant resistance to crack growth. As the area to be fractured increases with the extent of crack growth beneath the surface of observation, the grain boundary could still resist crack growth after the crack tip has passed the grain boundary on the surface, until the crack propagates through the whole boundary below the surface. A grain boundary with a large twist component could cause a short crack to arrest or branch. Studies of short fatigue crack growth in an Al–Li 8090 alloy plate provide evidence that supports the model.
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