响应度
薄脆饼
材料科学
光电探测器
光电子学
溅射沉积
溅射
宽带
比探测率
薄膜
波长
可见光谱
光学
纳米技术
物理
作者
Lanzhong Hao,Yongjun Du,Zegao Wang,Yupeng Wu,Hanyang Xu,Shichang Dong,Hui Liu,Yunjie Liu,Qingzhong Xue,Zhongying Han,Keyou Yan,Mingdong Dong
出处
期刊:Nanoscale
[The Royal Society of Chemistry]
日期:2020-01-01
卷期号:12 (13): 7358-7365
被引量:50
摘要
Wafer-size SnSe thin films with high uniformity and high crystal quality were grown by magnetron sputtering technique, and exhibit a highly sensitive to a broadband wavelength with high responsivity of 277.3 AW−1 and detectivity of 7.6 × 1011 Jones.
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