材料科学
纳米颗粒
光学
显微镜
显微镜
表征(材料科学)
光学显微镜
暗场显微术
纳米技术
扫描电子显微镜
物理
作者
Lukas Payne,Attilio Zilli,Yisu Wang,Wolfgang Langbein,Paola Borri
摘要
We present a wide-field imaging technique recently developed by us to measure quantitatively the optical extinction cross section σext of individual nanoparticles. The technique is simple, high speed, and enables the simultaneous acquisition of hundreds of nanoparticles in the wide-field image for statistical analysis, with a sensitivity corresponding to the detection of a single gold nanoparticle down to 2nm diameter. Notably, the method is applicable to any nanoparticle (dielectric, semiconducting, metallic), and can be easily and cost-effectively implemented on a conventional wide-field microscope. Of specific significance for accurate quantification, we show that σext depends on the numerical aperture of the microscope illumination due to the oblique incidence, even for spherical particles in an isotropic environment. This "long shadow" effect needs to be taken into account when comparing σext to theoretical values calculated under plane wave illumination at normal incidence. Owing to the accurate experimental quantification of σext, one can then use it to determine the nanoparticle size, as demonstrated here on gold nanoparticles of 30nm nominal diameter. This technique thus has the potential to become a simple and cost-effective new tool for accurate size characterization of single small nanoparticles, complementing time consuming and expensive methods such as electron microscopy.
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