互连
可靠性(半导体)
材料科学
弯曲
箔法
炸薯条
嵌入
电子工程
芯片级封装
计算机科学
光电子学
工程类
复合材料
电信
人工智能
物理
量子力学
功率(物理)
作者
Christof Landesberger,Nagarajan Palavesam,Waltraud Hell,A. Drost,Robert Faul,Horst Gieser,Detlef Bonfert,Karlheinz Bock,Christoph Kutter
标识
DOI:10.1109/icep.2016.7486872
摘要
We present technological results on the embedding of ultra-thin microcontroller ICs in flexible film substrates. The novel concept is based on the following technologies: face-up chip mounting in cavities on film laminates, photo-lithographic patterning of vias and interconnects embedding in polymer layer and compatibility with both sheet and roll-to-roll processing. The paper briefly reviews the benefit of embedding for ultra-thin dies in terms of mechanical robustness. For the technological demonstration, we used 25μm thin microcontroller IC and 50μm polyimide film substrates. Electrical interconnections were realized by sputtering of metal layers. Photolithography was performed on "wafer level" using aligner photomasks and a photo-sensitive polymer of 10μm thickness for embedding. The embedding process resulted in a mechanically flexible fan-out chip package of a thickness below 100μm. Perspectives and technological requirements for roll-to-roll manufacture as well as cost estimation for this kind of Thin Chip Foil Package are explained and discussed. Furthermore, we report our recent work on the development of an in-situ bending and electrical test equipment for flexible film modules. The new set-up was evaluated using ultra-thin test chips with daisy chain patterns that were ACA flip-chip bonded onto Polyimide films. It was found that reducing the chip thickness from 28μm to 12μm lead to a strong increase in mechanical strength of the chip-on-film (COF) assemblies tested under recurrent bending.
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