电缆密封套
电接点
接触电阻
可靠性(半导体)
失效机理
电阻和电导
机械故障
结构工程
材料科学
工程类
机械工程
电气工程
复合材料
功率(物理)
物理
图层(电子)
量子力学
医学
外科
作者
Yuan Meng,Wanbin Ren,Chao Zhang
出处
期刊:IEEE Transactions on Components, Packaging and Manufacturing Technology
[Institute of Electrical and Electronics Engineers]
日期:2022-08-11
卷期号:12 (9): 1533-1541
被引量:2
标识
DOI:10.1109/tcpmt.2022.3198107
摘要
Electrical connectors play an indispensable role in electrical and electronic systems. The frequently occurred intermittent failure events seriously affect the reliability of application systems. In this article, the repetitive mechanical insertion and withdrawal experiment of electrical connector is carried out by using our designed test rig and the intermittent failure phenomena recurs. The typical waveforms of contact resistance and force during the mating operation are presented. The variation laws of static contact resistance and dynamic contact resistance under intermittent failure condition are counted and analyzed. And the dynamic contact resistance is proven to be a suitable sensitive parameter to characterize the intermittent failure event. Based on the mathematical model, variation of surface morphology, and element analysis, the failure mechanism of electrical connectors under repetitive operation is proposed.
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