选择性
蚀刻(微加工)
材料科学
硅
过氧化物
纳米技术
光电子学
化学工程
催化作用
有机化学
化学
工程类
图层(电子)
作者
Francisco Javier López Villanueva,Farid Sebaai,Efrain Altamirano Sánchez,Andreas Klipp
出处
期刊:Solid State Phenomena
日期:2023-08-14
卷期号:346: 29-33
被引量:1
摘要
Using two highly efficient inhibitors, one for silicon and one for SiO 2 and SiN it is possible by varying the hydrogenperoxide concentration to achieve tuneable formulated chemistry concerning selectivity. So, the same formulation can be used for the selective etching of SiGe25 vs. Si like for GAA applications as well as for the selective etching of SiGe40 vs. SiGe20 like for CFET applications.
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