同步加速器
电子能量损失谱
同步辐射
表征(材料科学)
材料科学
扫描透射电子显微镜
分辨率(逻辑)
透射电子显微镜
能量(信号处理)
图像分辨率
光谱学
纳米技术
相(物质)
航程(航空)
光学
计算物理学
计算机科学
化学
物理
有机化学
量子力学
人工智能
复合材料
作者
James L. Hart,Andrew C. Lang,Y. Li,S. Shahrezaei,Darius Alix-Williams,Michael L. Falk,Suveen Mathaudhu,Anatoly I. Frenkel,Mitra L. Taheri
标识
DOI:10.1016/j.mtnano.2022.100298
摘要
Short range order (SRO) is critical in determining the performance of many important engineering materials. However, accurate characterization of SRO with high spatial resolution – which is needed for the study of individual nanoparticles and at material defects and interfaces – is often experimentally inaccessible. Here, we locally quantify SRO via scanning transmission electron microscopy with extended energy loss fine structure analysis. Specifically, we use novel instrumentation to perform electron energy loss spectroscopy out to 12 keV, accessing energies which are conventionally only possible using a synchrotron. Our data is of sufficient energy resolution and signal-to-noise ratio to perform quantitative extended fine structure analysis, which allows determination of local coordination environments. To showcase this technique, we investigate a multicomponent metallic glass nanolaminate and locally quantify the SRO with <10 nm spatial resolution; this measurement would have been impossible with conventional synchrotron or electron microscopy methods. We discuss the nature of SRO within the metallic glass phase, as well as the wider applicability of our approach for determining processing–SRO–property relationships in complex materials.
科研通智能强力驱动
Strongly Powered by AbleSci AI