折射率
材料科学
表面等离子共振
石墨烯
光学
原子层沉积
图层(电子)
全息术
表面等离子体子
吸收(声学)
纳米材料
等离子体子
显微镜
光电子学
反射(计算机编程)
表征(材料科学)
纳米技术
纳米颗粒
物理
复合材料
程序设计语言
计算机科学
作者
Siqing Dai,Hua Lü,Jiwei Zhang,Yuping Shi,Jiazhen Dou,Jianglei Di,Jianlin Zhao
出处
期刊:Optics Letters
[The Optical Society]
日期:2019-06-03
卷期号:44 (12): 2982-2982
被引量:11
摘要
The optical characterization of atomic-layer materials is significant for the clarification of fundamental physical properties of newly emerging nanomaterials. Here we propose to utilize the surface plasmon resonance (SPR) holographic microscopy to measure the complex refractive index (RI) of atomic-layer materials (i.e., graphene). We unambiguously determine the complex RI of single-layer graphene and few-layer graphene by fitting the measured reflection phase shift difference with theoretical values under the five-layer SPR model. The measurement results of the graphene layer grown by chemical vapor deposition at the visible range agree with the previous reports. Our method offers a cost-effective and robust avenue to characterize the complex RI of atomic-layer materials with distinct optical absorption, particularly the two-dimensional materials.
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