堆积
三维集成电路
节点(物理)
缩放比例
晶体管
CMOS芯片
计算机科学
集成电路
电子工程
消散
材料科学
集成电路设计
计算机体系结构
电气工程
嵌入式系统
光电子学
工程类
物理
结构工程
热力学
核磁共振
电压
数学
几何学
作者
Pascal Vivet,Sébastien Thuries,O. Billoint,Sylvain Choisnet,Didier Lattard,Édith Beigné,P. Batude
标识
DOI:10.1109/icecs.2018.8617955
摘要
Monolithic 3D technology (M3D) is a promising alternative to takle the loss of Moore's Law scaling beyond 22 nm node. By stacking different circuit layers thanks to nano-scale 3D Monolithic Inter Tier Via (MIV), it will be possible to offer a level of circuit integration never reached before, allowing advanced node scaling again as well as mixing heterogeneous technologies. M3D integrates sequentially different layers of transistors, with an ultra-fine pitch, in the 100 nm range, which is 200x smaller than state-of-the-art Through Silicon Vias (TSV) or 50x smaller than Copper to Copper Hybrid bonding (Cu-Cu HB). This high density 3D integration will pave the way towards new architectures, such as neuro- and bio-inspired applications, ultra-high density computing cube and smarter mixed signal devices within low power constraints. This paper presents an overview of M3D technology and potential applications, and in more detail its associated design challenges, respectively on physical implementation aspects and on thermal dissipation.
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