视频阵列图形
液晶显示器
材料科学
串扰
薄膜晶体管
氧化铟锡
光电子学
有源矩阵
像素
电容耦合
电极
光学
电气工程
物理
电压
纳米技术
薄膜
CMOS芯片
图层(电子)
量子力学
工程类
作者
Yoshimine Kato,Yoichi Hayashi
摘要
Abstract— The origin of vertical crosstalk (CT) was investigated experimentally and theoretically for an inorganic black matrix (BM) (amorphous‐SiGe:H) on the TFT array of a 10.4‐in. VGA LCD driven by a vertical‐line‐inversion method. It was found that there were two kinds of CT: electrically induced CT and optically induced CT. The first type was mainly due to capacitive coupling between a data line and an indium tin oxide (ITO) pixel electrode through the BM. It was calculated that a BM sheet resistance of more than 10 15 Ω/□ was needed to eliminate this kind of CT. The second type was due to low optical density (OD) of the BM, and it was found that an OD of 2.3 was necessary to eliminate it.
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