聚四氟乙烯
材料科学
介电强度
电介质
薄膜
复合材料
击穿电压
聚合物
电击穿
电压
电气故障
光电子学
电气工程
纳米技术
工程类
作者
Christopher M. Kerwien,Dennis L. Malandro,James R. Broomall
标识
DOI:10.1109/ceidp.2016.7785688
摘要
The DC dielectric breakdown strength of polytetrafluoroethylene (PTFE) thin films is not widely available. A large-area breakdown measurement on self-clearing polymer films rapidly provides extensive data sets, but presents challenges in data analysis. This research extends the large-area method used on BOPP and other polymers to PTFE thin films. Measurements obtained from the large-area method are compared to more traditional, single breakdown per sample measurements.
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