MOSFET
硅
光电子学
材料科学
工程物理
电气工程
电子工程
晶体管
工程类
电压
作者
Shima Khoshzaman,Ingo Hahn
标识
DOI:10.1109/icit46573.2021.9453693
摘要
Introducing the excellent advantages of using wide bandgap semiconductors such as gallium nitride (GaN) in the construction of the power devices has set a starting point for a new era in the history of power electronics. Replacing the silicon-based with GaN-based power devices promises a number of benefits. Higher power densities, switching speeds and temperature stabilities with lower on-state resistance, reduced conduction and switching losses and a reduction in the die size are some of the performance improvements that the GaN transistors offer. To show both the advantages and challenges regarding this new technology, the methodology for an eligible comparison between Si-based and GaN-based transistors has been explained. Experimental comparison has been performed between a 100 V commercially available enhancement mode GaN FET and two silicon-based MOSFETs, and the results are discussed in detail.
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