卤化物
钙钛矿(结构)
类金属
材料科学
无机化学
金属
纳米技术
化学
化学工程
工程类
冶金
作者
Zhengxun Lai,Yuxuan Zhang,You Meng,Xiuming Bu,Wei Wang,Pengshan Xie,Weijun Wang,Chuntai Liu,SenPo Yip,Johnny C. Ho
标识
DOI:10.1002/smtd.202201567
摘要
The operation stability of halide perovskite devices is the critical issue that impedes their commercialization. The main reasons are that the ambient H2 O molecules can easily deteriorate the perovskites, while the metal electrodes react in different degrees with the perovskites. Herein, one kind of new electrode, the metalloids, is reported, which are much more stable than the conventional noble metals as electrical contacts for halide perovskites. The degradation mechanism of halide perovskites with noble metal electrodes is carefully studied and compared with the metalloid electrodes. It is found that the iodide ions can easily halogenate Cu and Ag in halide perovskites. Although Au is almost not halogenated, it can also decompose the perovskite film. On the contrary, after long-term storage, the metalloid electrodes remain intact on the perovskite film without any degradation. In addition, the long-time operation stability of the perovskite devices with metalloid electrodes is much higher than that of noble metals. First-principles calculations confirm the exceptional stability of the metalloid electrodes.This work explores the ultra-stable electrodes for halide perovskites, paving the way to the large-scale deployment of perovskite-based electronic devices.
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