散热膏
散热片
可靠性(半导体)
热的
电子包装
温度循环
热阻
材料科学
计算机科学
汽车工程
机械工程
功率(物理)
工程类
复合材料
物理
量子力学
气象学
作者
Po-Yao Lin,Chien‐Hung Chen,Kathy Yan,Jun He
标识
DOI:10.1109/ectc51909.2023.00157
摘要
With the increasing package size and power consumption of HPC applications, controlling the thermal performance impact from the package-to-system interaction (PSI) in 2.5D/3D chiplet or heterogenous integration packages is crucial for ensuring their long-term reliability in typical operating environments. The present study thus conducts an experimental and numerical analysis of the thermal performance impact of the PSI in a large lidless type 2.5D chiplet heterogeneous integration system with a fanout area more than twice the size of the reticle. The analysis focuses particularly on the effects of the heatsink contact pressure and thermal interface material (TIM) on the thermal performance of the package. The results show that the on-die temperature distribution varies inversely with the heatsink contact pressure. Furthermore, the power cycling test results indicate that phase change materials (PCMs) suffer less degradation than thermal grease after prolonged cycling due to the avoidance of a pump-out effect. Overall, the results suggest that a uniform heatsink contact pressure and the use of PCM materials as the TIM are essential factors in improving the stringent thermal and reliability requirements of high power and large 2.5/3D HPC packages in system environment.
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