材料科学
瓶颈
电介质
电力系统
工程物理
纳米技术
计算机科学
功率(物理)
工程类
光电子学
量子力学
物理
嵌入式系统
作者
Baoquan Wan,Xiaodi Dong,Xing Yang,Jiangqiong Wang,Ming‐Sheng Zheng,Zhi‐Min Dang,George Chen,Jun‐Wei Zha
标识
DOI:10.1002/adma.202301185
摘要
Abstract Polyimides (PIs) are widely used in circuit components, electrical insulators, and power systems in modern electronic devices and large electrical appliances. Electrical/mechanical damage of materials are important factors that threaten reliability and service lifetime. Dynamic (self‐healable, recyclable and degradable) PIs, a promising class of materials that successfully improve electrical/mechanical properties after damage, are anticipated to solve this issue. The viewpoints and perspectives on the status and future trends of dynamic PI based on a few existing documents are shared. The main damage forms of PI dielectric materials in the application process are first introduced, and initial strategies and schemes to solve these problems are proposed. Fundamentally, the bottleneck issues faced by the development of dynamic PIs are indicated, and the relationship between various damage forms and the universality of the method is evaluated. The potential mechanism of the dynamic PI to deal with electrical damage is highlighted and several feasible prospective schemes to address electrical damage are discussed. This study is concluded by presenting a short outlook and future improvements to systems, challenges, and solutions of dynamic PI in electrical insulation. The summary of theory and practice should encourage policy development favoring energy conservation and environmental protection and promoting sustainability.
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