三角积分调变
逐次逼近ADC
前馈
CMOS芯片
动态范围
电子工程
带宽(计算)
偏移量(计算机科学)
计算机科学
放大器
算法
数学
电气工程
工程类
电信
比较器
电压
控制工程
程序设计语言
作者
Shulin Zhao,Mingqiang Guo,Liang Qi,Dengke Xu,Guoxing Wang,Rui P. Martins,Sai‐Weng Sin
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2023-05-26
卷期号:58 (10): 2722-2732
标识
DOI:10.1109/jssc.2023.3275636
摘要
A noise-shaping successive approximation register (NS-SAR) ADC combines the merits of the $\Delta $ - $\Sigma $ and SAR ADC, transforming it into an emerging ADC architecture to reach high resolution with good power efficiency. The single-channel NS-SAR with high resolution, however, suffers from bandwidth (BW) limitations. The time-interleaved (TI) NS-SAR mitigates the speed bottleneck but faces challenges in obtaining high resolution and BW simultaneously due to the lack of a sharp noise transfer function (NTF). This article presents a calibration-free two-channel TI-NS-SAR with an aggressive second-order NTF for high resolution. Based on a one-time error feedback (FB) at midway, we propose a second-order error-feedforward (FF) to enhance the noise-shaping (NS) effect further meanwhile avoiding the excessive NTF peaking and dynamic range (DR) loss. A dynamic residue amplifier shared between two channels lowers the offset, which reduces the redundant bit to only one bit, thus improving the efficiency of SAR conversion. Fabricated in a 28 nm CMOS with 1 V supply, the prototype achieves 73.2 dB-signal-to-noise-and-distortion-ratio (SNDR) over 30 MHz-BW when operating at 330 MHz. It consumes 3.07 mW and exhibits a Schreier FoM (FoMs) of 173.1 dB.
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