堆积
材料科学
炸薯条
通过硅通孔
三维集成电路
电子工程
硅
光电子学
功率消耗
计算机科学
功率(物理)
集成电路
工程类
电信
物理
核磁共振
量子力学
作者
Deok Young Jung,Kwangjin Moon,Byung-Lyul Park,Gil Heyun Choi,Ho-Kyu Kang,Chilhee Chung,Yong-han Rho
标识
DOI:10.1109/asmc.2012.6212888
摘要
As semiconductor performance improvements through device scale-down becomes more difficult, 3D chip stacking technology with TSVs (Through Silicon Via) is becoming an increasingly attractive solution to achieve higher system performances by way of higher bandwidth, smaller form factor and lower power consumption. Such increase in performance using TSV aided 3D chip stacking technology applies not only to homogenous chip stacking but to heterogeneous chip stacking (e.g. memory device on logic) as well, making it ideal for such applications in high performance mobile devices.
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