光刻
计算光刻
极紫外光刻
平版印刷术
材料科学
多重图案
光学
纳米光刻
微电子
无光罩微影
下一代光刻
浸没式光刻
光电子学
光掩模
抵抗
纳米技术
电子束光刻
制作
物理
医学
替代医学
病理
图层(电子)
出处
期刊:Technical Physics
[Springer Nature]
日期:2011-08-01
卷期号:56 (8): 1061-1073
被引量:116
标识
DOI:10.1134/s1063784211080214
摘要
The current status of basic photolithographic techniques allowing researchers to achieve results that seemed to be unrealistic even a short time ago is reviewed. For example, advanced DUV photolithography makes it possible to exactly reproduce IC elements 25 times smaller in size than the wavelength of an excimer laser used as a lithographic tool. Approaches owing to which optical lithography has pushed far beyond the Rayleigh-Abbe diffraction limit are considered. Among them are optical proximity correction, introduction of an artificial phase shift, immersion, double exposure, double patterning, and others. The prospects for further advancement of photolithography into the nanometer range are analyzed, and the capabilities of photolithography are compared with those of electronolithography, EUV lithography, and soft X-ray lithography
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