平面度测试
分子内力
分子间力
共轭体系
化学机械平面化
堆积
材料科学
连锁
化学物理
带隙
计算化学
化学
结晶学
纳米技术
分子
立体化学
光电子学
聚合物
有机化学
复合材料
生物化学
DNA
图层(电子)
作者
Yuxuan Che,Dmitrii F. Perepichka
标识
DOI:10.1002/anie.202011521
摘要
Abstract Planarity is essential for many organic electronic materials as it maximizes the intramolecular π‐orbital overlap and enables efficient intermolecular interactions through π‐stacking. We propose a statistical way of quantifying the planarity of a wide range of conjugated systems. The quantification takes into account all torsional conformations and their relative contribution to the overall structural disorder, through a planarity index ⟨cos 2 ϕ ⟩. The propensity for planarization and the effect of rotational disorder were examined for a series of commonly used building blocks. The application of the analysis to extended conjugated systems and the correlations between the gas‐phase ⟨cos 2 ϕ ⟩ and crystallographically observed planarity in the solid state were explored. Our calculations also reveal a previously unrecognized effect of increasing band gap upon planarization for conjugated systems coupling strong electron donor and acceptor units.
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