材料科学
聚二甲基硅氧烷
弯曲
紧迫的
电容
图层(电子)
复合材料
压力传感器
纳米线
灵敏度(控制系统)
背压
光电子学
电子工程
机械工程
电极
化学
工程类
物理化学
作者
Jianhao Wu,Qiuming Lan,Weijia Yang,Xin He,Yunting Yue,Jiayi Jiang,Tinghui Jiang
出处
期刊:IOP conference series
[IOP Publishing]
日期:2018-01-01
卷期号:301: 012007-012007
被引量:1
标识
DOI:10.1088/1757-899x/301/1/012007
摘要
Ag nanowire (NW)/polydimethylsiloxane (PDMS) pressure sensors with the three-layer and back-to-back structures were fabricated by a coating-peeling method. The bending and pressing responses of the sensors were comparably investigated. The results reveal that two kinds of pressure sensors show similar response linearity in the bending test with a bending angle of 0-180°. However, the response sensitivity of the three-layer structured pressure sensor is superior to that of the back-to-back structural one, which exhibits that the relationship between the capacitance value (Y) and the bending angle (X) is: Y = 0.01244X + 2.9763. On the contrary, in the pressing test, the response sensitivity of the back-to-back structural sensor is better than that of the three-layer structural one. The relationship between capacitance value (Y) and the number of paper clips (pressure, X2) is Y = 0.09241X2 + 88.03597.
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