表征(材料科学)
材料科学
透射电子显微镜
光谱学
能量色散X射线光谱学
扫描透射电子显微镜
扫描电子显微镜
电子显微镜
纳米技术
分析化学(期刊)
原位
X射线光谱学
光学
化学
物理
色谱法
有机化学
量子力学
复合材料
作者
Nestor J. Zaluzec,M.G. Burke,Sarah J. Haigh,Matthew A. Kulzick
标识
DOI:10.1017/s1431927614000154
摘要
Abstract The use of analytical spectroscopies during scanning/transmission electron microscope (S/TEM) investigations of micro- and nano-scale structures has become a routine technique in the arsenal of tools available to today’s materials researchers. Essential to implementation and successful application of spectroscopy to characterization is the integration of numerous technologies, which include electron optics, specimen holders, and associated detectors. While this combination has been achieved in many instrument configurations, the integration of X-ray energy-dispersive spectroscopy and in situ liquid environmental cells in the S/TEM has to date been elusive. In this work we present the successful incorporation/modifications to a system that achieves this functionality for analytical electron microscopy.
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