期刊:IEEE Transactions on Circuits and Systems Ii: Analog and Digital Signal Processing [Institute of Electrical and Electronics Engineers] 日期:2006-07-01卷期号:53 (7): 541-545被引量:269
标识
DOI:10.1109/tcsii.2006.875308
摘要
The latched comparator is a building block of virtually all analog-to-digital converter architectures. It uses a positive feedback mechanism to regenerate the analog input signal into a full-scale digital level. The large voltage variations in the internal nodes are coupled to the input, disturbing the input voltage-this is usually called kickback noise. This brief reviews existing solutions to minimize the kickback noise and proposes two new ones. HSPICE simulations of comparators implemented in a 0.18-/spl mu/m technology demonstrate their effectiveness.