可靠性(半导体)
逆高斯分布
加速寿命试验
置信区间
百分位
统计
推论
计算机科学
区间估计
压力(语言学)
高斯过程
高斯分布
可靠性理论
降级(电信)
区间(图论)
反向
可靠性工程
算法
数学
人工智能
工程类
故障率
分布(数学)
数学分析
哲学
功率(物理)
物理
威布尔分布
组合数学
电信
量子力学
语言学
几何学
作者
Peihua Jiang,Bing Xing Wang,Xiaofei Wang,Tzong‐Ru Tsai
标识
DOI:10.1109/tr.2023.3328369
摘要
An inverse Gaussian step-stress accelerated degradation test model was put forward, in which the drift and shape parameters are functions of the stress levels. The confidence intervals of the model parameters and some reliability measures, such as the mean lifetime, the reliability function, and the p th percentile under the rated usage stress, are presented. The online and offline remaining useful life prediction intervals under the rated usage stress level are also acquired. Simulation technologies are used to examine the effect of the presented interval estimation approaches. Simulation results manifest that the presented interval estimation method performs well in all cases. Finally, a case study is provided to illustrate our inference approaches.
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