马赫-曾德尔干涉仪
干涉测量
氮化硅
材料科学
光学滤波器
光电子学
硅
硅光子学
氮化物
光学
物理
纳米技术
图层(电子)
作者
Liyu Chen,Yongjun Chen,Wen-Hsien Huang,Chun‐Ta Wang
标识
DOI:10.1109/siphotonics60897.2024.10544360
摘要
We demonstrated a Mach-Zehnder interferometer filter with a 20 nm free spectral range in the C-band. By optimizi ng the arm widths, we reduced temperature-induced wavelength sensitivity from 16 to just 0.5 m/°C, improving device stability.
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