Data acquisition in powder X-ray diffraction measurements using an area detector

Area detectors have been widely used in X-ray diffraction (XRD) to improve the acquisition speed and data quality. Here, an accurate, high efficiency, low distortion approach with a large angle range for collecting powder X-ray diffraction data is developed which is carried out by rotating a small area detector on the detector arm of the diffractometer. A series of collected images are spliced and converted into one 1D XRD pattern. The calculation of the 2θ value and intensity corresponding to every pixel are shown in detail. The calibration of the detector and experimental geometry was carried out. Finally, the reliability of this method has been demonstrated by the X-ray diffraction measurements of a standard LaB6 powder and Rietveld refinement results.