消色差透镜
光学
硅
蚀刻(微加工)
材料科学
焦距
波长
红外线的
光电子学
物理
纳米技术
镜头(地质)
图层(电子)
作者
Dongzhi Shan,Nianxi Xu,Jinsong Gao,Naitao Song,Hai Liu,Yang Tang,Xiaoguo Feng,Yansong Wang,Yi Zhao,Xin Chen,Qiao Sun
出处
期刊:Optics Express
[The Optical Society]
日期:2022-04-01
卷期号:30 (8): 13616-13616
被引量:20
摘要
An all-silicon long-wavelength infrared (LWIR) achromatic metalens based on deep silicon etching is designed in this paper. With a fixed aperture size, the value range of the equivalent optical thickness of the non-dispersive meta-atoms constructing the achromatic metalens determines the minimum f-number. The fabrication characteristic with high aspect ratio of deep silicon etching amplifies the difference value of optical thickness between different meta-atoms by increasing the propagation distance of the propagation mode, which ensures a small f-number to obtain a better imaging resolution. A 280-µm-diameter silicon achromatic metalens with a f-number of 1 and the average focusing efficiency of 27.66% has been designed and simulated to validate the feasibility of this strategy. The simulation results show that the maximum focal length deviation percentage from the target value between the wavelength of 8.6 and 11.4 µm is 1.61%. This achromatic metalens design is expected to play a role in the field of LWIR integrated optical system.
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