光学相干层析成像
材料科学
光学
可靠性(半导体)
无损检测
连贯性(哲学赌博策略)
计算机科学
生物医学工程
物理
功率(物理)
量子力学
医学
作者
Nam Hyun Cho,Kibeom Park,Jae‐Young Kim,Yeongri Jung,Jeehyun Kim
标识
DOI:10.1016/j.optlaseng.2014.12.013
摘要
We investigated the use of optical coherence tomography (OCT) to measure several materials immersed in optical adhesives. The effects of variations in the concentration, physical characteristics, and thickness of the materials were studied, and these parameters were found to significantly affect the OCT measurement. The materials were selected for their distinct spectral properties in the infrared region. To ensure reliability, we acquired images using a scanning electron microscope after performing the semiconductor production process. We verified the feasibility of the application of OCT for defect inspection and product verification of touch-screen panels.
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