带材弯曲
覆盖层
材料科学
氧化物
宽禁带半导体
弯曲
价带
电子能带结构
光电子学
带隙
凝聚态物理
复合材料
冶金
物理
作者
Michael A. Garcia,Scott D. Wolter,Tong-Ho Kim,Soojeong Choi,Jamie Baier,April S. Brown,María Losurdo,Giovanni Bruno
摘要
A trend of increased near-surface valence band maximum band bending with increasing O∕Ga relative fraction was observed, extrapolating to 2.7eV±0.1eV for pristine GaN surfaces (0% O 1s peak area). This trend of apparent oxide overlayer coverage affecting the band bending linearly could lead to better understanding and characterization of oxidized GaN surfaces to control band bending for sensors or other devices.
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