基质(水族馆)
材料科学
薄脆饼
过程(计算)
薄膜
光学
直线(几何图形)
纳米技术
计算机科学
物理
几何学
数学
海洋学
操作系统
地质学
作者
Ichiro Ueno,Kanji Hirose,Yusuke Kizaki,Yoshiaki Kisara,Yoshizumi Fukuhara
出处
期刊:Journal of heat transfer
[ASME International]
日期:2012-04-13
卷期号:134 (5)
被引量:11
摘要
The authors pay their special attention to formation process of wafer-thin liquid film, known as “precursor film,” ahead moving macroscopic contact line of a droplet spreading on a solid substrate. The spreading droplet on the solid substrate is accompanied with the movement of a visible boundary line so-called “macroscopic contact line.” Existing studies have indicated there exits a thin liquid film known as precursor film ahead the macroscopic contact line of the droplet. The present author’s group has dedicated their special effort to detect the formation process of the precursor film by applying a convectional laser interferometry and a high-speed camera, and to evaluate the spreading rate of the precursor film. In the present study, existing length of the precursor film at a very early stage of the droplet spreading is evaluated by applying a Brewster-angle microscopy as well as the interferometer. The authors extend their attention to the advancing process of the precursor film on inclined substrate.
科研通智能强力驱动
Strongly Powered by AbleSci AI