聚乙烯
聚合物
材料科学
降级(电信)
化学物理
分子动力学
电介质
工作(物理)
纳米技术
计算化学
化学
计算机科学
热力学
复合材料
物理
电信
光电子学
作者
Lihua Chen,Tran Doan Huan,Rampi Ramprasad
摘要
Chemical defects can progressively degrade the electronic structure of polymer dielectrics, ultimately leading to their failure. Because the polymer degradation and breakdown related processes are notably complicated in nature, they remain far from being understood both experimentally and computationally. Using a combination of density functional theory calculations and classical molecular dynamics simulations, we propose seven atomistic mechanisms for the formation of common chemical defects in polyethylene using which a variety of defect-related experimental observations can be explained. This work provides a comprehensive connection among the experiments related to polyethylene defects and aging, laying the groundwork for an understanding of polymer degradation and breakdown.
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