二氧化硅
蚀刻(微加工)
氢氟酸
光刻
干法蚀刻
硅
抵抗
材料科学
光电子学
反应离子刻蚀
平版印刷术
缓冲氧化物腐蚀
平面的
纳米技术
复合材料
计算机科学
冶金
计算机图形学(图像)
图层(电子)
作者
P.J. Holmes,J.E. Snell
标识
DOI:10.1016/0026-2714(66)90162-4
摘要
The vapour of hydrofluoric acid attacks silicon dioxide at room temperatures, at a rate comparable to that of the buffered solution of the acid normally used as the etchant for the photolithographic stage of planar silicon device technology. The reaction has been examined as a possible alternative to liquid etching in the processing of devices, and experiments have been performed to evaluate various proprietary photo-resists for use with vapour etching.
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