脉冲激光沉积
图层(电子)
材料科学
基质(水族馆)
薄膜
沉积(地质)
缓冲器(光纤)
衍射
光电子学
激光器
分析化学(期刊)
光学
纳米技术
化学
色谱法
电信
生物
海洋学
物理
地质学
古生物学
计算机科学
沉积物
作者
V. Crăciun,J. Elders,Han Gardeniers,J. Geretovsky,Ian W. Boyd
标识
DOI:10.1016/0040-6090(94)09479-9
摘要
ZnO thin films have been grown on GaAs substrates using the pulsed laser deposition technique with or without a photodeposited SiO2 buffer layer. The presence of the SiO2 layer has a beneficial effect on the crystalline quality of the grown ZnO films. Highly c-axis oriented ZnO films having a full width at half maximum value of the (002) X-ray diffraction line of less than 0.13 ° have been grown on such buffer layers at a substrate temperature of only 350 °C.
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