材料科学
蚀刻(微加工)
光电子学
激光器
准分子激光器
发光二极管
表面粗糙度
二极管
各向同性腐蚀
图层(电子)
氮化镓
宽禁带半导体
光学
辐照
表面光洁度
复合材料
物理
核物理学
作者
Wei-Chi Lee,Shui-Jinn Wang,Kai-Ming Uang,Tron-Min Chen,Der-Ming Kuo,Pei-Ren Wang,Po-Hong Wang
标识
DOI:10.1109/lpt.2010.2055047
摘要
A two-step roughening process that uses a KrF excimer laser and KOH chemical etching for the n-GaN layer surface of vertically structured GaN-based light-emitting diodes (VLEDs) to yield circular protrusions with hexagonal cones atop for light extraction enhancement is demonstrated. A possible mechanism of the formation of the circular protrusions commenced by laser irradiation with nonuniform etching rates at sites with various dislocation densities was investigated. An improvement in light output power of about 95% at 350-750 mA compared to that of flat VLEDs was obtained for the two-step roughened VLEDs, which is attributed to the increase in surface emission area and dimensions of roughness, and, in particular, the decrease in the n-GaN layer thickness.
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