聚酰亚胺
材料科学
半导体
涂层
成形性
可靠性(半导体)
半导体器件制造
光电子学
半导体器件
纳米技术
工程物理
复合材料
图层(电子)
工程类
物理
薄脆饼
功率(物理)
量子力学
作者
Kohji Katoh,Masayuki Ohe,Hiroshi Komatsu,Takeharu Motobe,Takashi Hattori,Takumi Ueno
出处
期刊:ECS transactions
[The Electrochemical Society]
日期:2007-04-27
卷期号:6 (3): 721-735
被引量:1
摘要
In this paper, new polyimide coating technologies will be reported that are useful for next generation semiconductor applications. Traditionally, polyimide materials (PI) have been used as stress buffer and rewiring cover layers to improve semiconductor reliability. However, over recent years, due to process cost reduction, conventional PI has gradually been replaced by photosensitive PI (PSPI). In order to meet the next generation semiconductor applications for stress buffer and packaging, photolithographic performance, Cu compatibility, thicker film thickness formability and low temperature cure are critical process properties that need to be addressed. Development of functional PSPI technologies at HDM to meet each of these needs will be discussed in this paper.
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