坐标测量机
度量(数据仓库)
计算机科学
钥匙(锁)
工程制图
工程类
系统工程
软件工程
制造工程
机械工程
数据挖掘
操作系统
作者
Kiyoshi Takamasu,Masahiko Hiraki,Kazuhiro Enami,Shigeo Ozono
摘要
The Coordinate Measuring Machines (CMMs) are widely used for the three-dimensional measurements of workpieces. For solving the limits and the drawbacks of the traditional CMM, we have started developing novel systems and key technologies for 21th century CMMs. In this article, we introduce two of our developing projects; “Nano-CMM project” and “Parallel-CMM project.” In the Nano-CMM project, our intention is developing the CMM with nanometer resolution to measure three dimensional positions, orientations and parameters of three dimensional features. And, in the Parallel-CMM project, we develop the CMM using parallel mechanisms to measure large machine parts quickly with high accuracy.
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