拓扑绝缘体
带隙
材料科学
光电子学
铋
蓝移
薄膜
缩放比例
拓扑(电路)
凝聚态物理
物理
纳米技术
光致发光
数学
组合数学
冶金
几何学
作者
Yub Raj Sapkota,Asma Alkabsh,Aaron Walber,Hassana Samassekou,Dipanjan Mazumdar
摘要
Optical bandgap properties of high-quality few-layer topological insulator Bi2Se3 thin films are investigated using broadband absorption spectroscopy. We provide direct optical evidence for blue shift in the bulk bandgap of Bi2Se3 as it approaches the two-dimensional limit. The blue shift is robust and observed in both protected (capped) and exposed (uncapped) thin films. The behavior is strongest below six quintuple layers (QLs), particularly at the 2 and 3 QL level, where finite-size effects are known to be most significant in Bi2Se3. A further bandgap increase is observed in all films that we attribute to the Burstein-Moss effect. Our result provides additional insights into the scaling behavior of topological materials. The bandgap increase has a significant impact on the electronic and optoelectronic applications of topological insulators.
科研通智能强力驱动
Strongly Powered by AbleSci AI